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Jerry Seidler: Overview of lab XAFS/XES
After decades of relative silence, lab-based spectroscopy has made a comeback in recent years. Modern spectrometers have energy resolution comparable to synchrotron XAS beamlines and have performances demonstrated in dozens of recent publications. Here, I will briefly summarize the various technical approaches before focusing on examples for XAFS and XES in the hard and tender regime. A unifying theme of much of this work can be termed “analytical XAS”, where many applications require very high access for iterative measurement of material properties — a use model that fits poorly with synchrotron scheduling. I will conclude with a discussion of several schemes for the interplay between synchrotron and lab-based XAS, with an emphasis on the already clear fact that these two approaches are generally complemnetary rather than competitive.